イベント・研究会

国際医工学セミナー

International Seminar Series on Biomedical Engineering

千葉大学国際医工学セミナー

70th
Date and Time: Thursday, February 13, 2025
17:00 - 18:00
Venue: B101 Meeting Room, 1st floor of Building B, CFME, Chiba University
(千葉大学フロンティア医工学センターB棟1階会議室)

TITLE

Quantifying Image Haziness: a Contrast Metric for Evaluating Optical Scattering Depth

LECTURER

George C. Cardoso
(Physics Dep., University of Sao Paulo, Ribeirão Preto, Brazil)

ABSTRACT

Image contrast lacks a universally accepted definition in the literature. In this talk, we introduce the Haziness Contrast Metric to evaluate the image clarity of objects obscured by a translucent medium, a common challenge in biomedical imaging. The haziness metric exhibits monotonic behavior, a near-linear response to increasing optical scattering depth or material density, and a broader dynamic range compared to conventional contrast metrics. Mathematically, the haziness metric compares normalized histograms of multiple image blocks, analyzed pairwise. To validate the metric, we use RGB images of a target submerged in a scattering medium with different optical depths. We further demonstrate the applicability of the haziness metric by evaluating a vein visualization device, using a phantom model composed of water and milk to simulate tissue scattering. The haziness metric effectively quantifies the clarity of the infrared imaging system, providing objective insights for optimizing image acquisition and processing pipelines. The haziness metric is a practical new tool for imaging contrast optimization, particularly in biomedical imaging.

Main reference: Vitor, André R., Arie Shaus, and George C. Cardoso. 2023. "Image Haziness Contrast Metric Describing Optical Scattering Depth" Optics 4, no. 4: 525-537. https://doi.org/10.3390/opt4040038

Biography

George C. Cardoso (D.Sc.) is a tenured professor at the University of São Paulo, Brazil, specializing in the application of optical methods and systems to develop cost-effective biomedical solutions. His research has led to over 30 peer-reviewed publications and more than 20 granted U.S. and international patents. For three years, Dr. Cardoso served as an elected member of the Executive Committee of the American Physical Society's New York State chapter. His professional experience includes six years as a research scientist at the Xerox Research Center (PARC East) and an additional six years of academic appointments at Haverford College, Adelphi University, and Northwestern University. He earned his D.Sc. in atomic and optical physics at the Federal University of Pernambuco, Recife, Brazil.


世話人:羽石秀昭 教授